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"A diagnostic test generation procedure for synchronous sequential circuits ..."

Irith Pomeranz, Sudhakar M. Reddy (1998)

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DOI: 10.1109/TEST.1998.743306

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/itc/PomeranzR98
Irith Pomeranz, Sudhakar M. Reddy:
A diagnostic test generation procedure for synchronous sequential circuits based on test elimination. ITC 1998: 1074-1083

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