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"Reducing Test Data Volume Using Random-Testable and Periodic-Testable Scan ..."

Irith Pomeranz (2003)

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DOI: 10.1109/TEST.2003.1270869

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/itc/Pomeranz03
Irith Pomeranz:
Reducing Test Data Volume Using Random-Testable and Periodic-Testable Scan Chains in Circuits with Multiple Scan Chains. ITC 2003: 441-450

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