"Design-for-test methods for stand-alone SRAMs at 1 Gb/s/pin and beyond."

Harold Pilo et al. (2000)

Details and statistics

DOI: 10.1109/TEST.2000.894235

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

a service of  Schloss Dagstuhl - Leibniz Center for Informatics