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"Modeling and Testing Process Variation in Nanometer CMOS."

Mehrdad Nourani, Arun Radhakrishnan (2006)

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DOI: 10.1109/TEST.2006.297716

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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  dblp key:
  - conf/itc/NouraniR06
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  - https://dblp.org/rec/conf/itc/NouraniR06
Mehrdad Nourani, Arun Radhakrishnan:
Modeling and Testing Process Variation in Nanometer CMOS. ITC 2006: 1-10

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