"Redundancy Test for 1 Mbit DRAM Using Multi-Bit-Test Mode."

Y. Nishimura et al. (1986)

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metadata version: 2022-04-08

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Y. Nishimura, Mitsuhiro Hamada, Hideto Hidaka, Hideyuki Ozaki, Kazuyasu Fujishima, Y. Hayasaka:
Redundancy Test for 1 Mbit DRAM Using Multi-Bit-Test Mode. ITC 1986: 826-829

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