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"Test Time and Area Optimized BrST Scheme for Automotive ICs."

Nilanjan Mukherjee et al. (2019)

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DOI: 10.1109/ITC44170.2019.9000133

access: closed

type: Conference or Workshop Paper

metadata version: 2020-02-24

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  dblp key:
  - conf/itc/MukherjeeTTSLMM19
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  - https://dblp.org/rec/conf/itc/MukherjeeTTSLMM19
Nilanjan Mukherjee, Jerzy Tyszer, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki:
Test Time and Area Optimized BrST Scheme for Automotive ICs. ITC 2019: 1-10

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