"Non-contact Testing for SoC and RCP (SIPs) at Advanced Nodes."

Brian Moore et al. (2008)

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DOI: 10.1109/TEST.2008.4700612

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Brian Moore, Marc Mangrum, Chris Sellathamby, Md. Mahbub Reja, T. Weng, Brenda Bai, Edwin Walter Reid, Igor M. Filanovsky, Steven Slupsky:
Non-contact Testing for SoC and RCP (SIPs) at Advanced Nodes. ITC 2008: 1-10

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