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"Electrical package defect testing for volume production."

Xue Ming et al. (2015)

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DOI: 10.1109/TEST.2015.7342400

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Xue Ming, Koelz Johann, Lee Chow York, Lee Kwan Wee, Shi Zhi Min:
Electrical package defect testing for volume production. ITC 2015: 1-9

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