"Scalable BIST for Linearity Testing of Sigma-Delta Modulators."

Krishna Pramod Madabhushi et al. (2024)

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DOI: 10.1109/ITC51657.2024.00021

access: closed

type: Conference or Workshop Paper

metadata version: 2024-12-10

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Krishna Pramod Madabhushi, Trevor LaBanz, Sudip Dandnaik, Eslam Hag:
Scalable BIST for Linearity Testing of Sigma-Delta Modulators. ITC 2024: 66-70

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