"Smart Sampling for Efficient System Level Test: A Robust Machine Learning ..."

Chenwei Liu, Jie Ou (2021)

> Home

Details and statistics

DOI: 10.1109/ITC50571.2021.00013

access: closed

type: Conference or Workshop Paper

metadata version: 2021-11-29

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/itc/LiuO21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/LiuO21
Chenwei Liu, Jie Ou:
Smart Sampling for Efficient System Level Test: A Robust Machine Learning Approach. ITC 2021: 53-62

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.