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"Adaptive Methods for Machine Learning-Based Testing of Integrated Circuits ..."

Mengyun Liu, Krishnendu Chakrabarty (2021)

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DOI: 10.1109/ITC50571.2021.00023

access: closed

type: Conference or Workshop Paper

metadata version: 2021-11-29

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Mengyun Liu, Krishnendu Chakrabarty:
Adaptive Methods for Machine Learning-Based Testing of Integrated Circuits and Boards. ITC 2021: 153-162

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