Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Doing more with less - An IEEE 1149.7 embedded tutorial : Standard for ..."

Adam W. Ley (2009)

> Home

Details and statistics

DOI: 10.1109/TEST.2009.5355572

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/itc/Ley09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/Ley09
Adam W. Ley:
Doing more with less - An IEEE 1149.7 embedded tutorial : Standard for reduced-pin and enhanced-functionality test access port and boundary-scan architecture. ITC 2009: 1-10

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.