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"Membrane Probe Card Technology (the Future for High Performance Wafer Test)."

Brian Leslie, Farid Matta (1988)

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DOI: 10.1109/TEST.1988.207842

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Brian Leslie, Farid Matta:
Membrane Probe Card Technology (the Future for High Performance Wafer Test). ITC 1988: 601-607

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