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"Predictor BIST: An "All-in-One" Optical Test Solution for CMOS Image Sensors."

J. Lefevre et al. (2023)

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DOI: 10.1109/ITC51656.2023.00048

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-09

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J. Lefevre, P. Debaud, P. Girard, Arnaud Virazel:
Predictor BIST: An "All-in-One" Optical Test Solution for CMOS Image Sensors. ITC 2023: 310-319

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