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"Hierarchical Test Program Development for Scan Testable Circuits."

Jens Leenstra, Lambert Spaanenburg (1991)

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DOI: 10.1109/TEST.1991.519697

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Jens Leenstra, Lambert Spaanenburg:
Hierarchical Test Program Development for Scan Testable Circuits. ITC 1991: 375-384

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