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"Expert System for the Functional Test Program Generation of Digital ..."

Stephen M. Lea et al. (1988)

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DOI: 10.1109/TEST.1988.207805

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Stephen M. Lea, Nigel Brown, Tim Katz, Phil Collins:
Expert System for the Functional Test Program Generation of Digital Electronic Circuit Boards. ITC 1988: 209-220

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