"Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ."

Ali Keshavarzi et al. (2000)

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DOI: 10.1109/TEST.2000.894318

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Manoj Sachdev, Krishnamurthy Soumyanath, Vivek De:
Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ. ITC 2000: 1051-1059

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