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"Achieving Board-Level BIST Using the Boundary-Scan Master."

Najmi T. Jarwala, Chi W. Yau (1991)

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DOI: 10.1109/TEST.1991.519729

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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  - https://dblp.org/rec/conf/itc/JarwalaY91
Najmi T. Jarwala, Chi W. Yau:
Achieving Board-Level BIST Using the Boundary-Scan Master. ITC 1991: 649-658

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