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"Multiple tests for each gate delay fault: higher coverage and lower test ..."
Shahdad Irajpour, Sandeep K. Gupta, Melvin A. Breuer (2005)
- Shahdad Irajpour, Sandeep K. Gupta, Melvin A. Breuer:
Multiple tests for each gate delay fault: higher coverage and lower test application cost. ITC 2005: 9
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