"Diagnostic test generation for transition faults using a stuck-at ATPG tool."

Yoshinobu Higami et al. (2009)

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DOI: 10.1109/TEST.2009.5355681

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Yoshinobu Higami, Yosuke Kurose, Satoshi Ohno, Hironori Yamaoka, Hiroshi Takahashi, Yoshihiro Shimizu, Takashi Aikyo, Yuzo Takamatsu:
Diagnostic test generation for transition faults using a stuck-at ATPG tool. ITC 2009: 1-9

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