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"Test Head Design Using Electro-Optic Receivers and GaAs Pin Electronics ..."
Francois J. Henley, Hee-June Choi (1988)
- Francois J. Henley, Hee-June Choi:
Test Head Design Using Electro-Optic Receivers and GaAs Pin Electronics for a Gigahertz Production Test System. ITC 1988: 700-709
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