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"Defect-Directed Stress Testing Based on Inline Inspection Results."

Chen He et al. (2022)

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DOI: 10.1109/ITC50671.2022.00050

access: closed

type: Conference or Workshop Paper

metadata version: 2023-01-05

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  dblp key:
  - conf/itc/HeGAWFKRPRSL22
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  - https://dblp.org/rec/conf/itc/HeGAWFKRPRSL22
Chen He, Paul Grosch, Onder Anilturk, Joyce Witowski, Carl Ford, Rahul Kalyan, John C. Robinson, David W. Price, Jay Rathert, Barry Saville, Dave Lee:
Defect-Directed Stress Testing Based on Inline Inspection Results. ITC 2022: 427-435

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