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"Test time reduction of successive approximation register A/D converter by ..."
Shalabh Goyal et al. (2005)
- Shalabh Goyal, Abhijit Chatterjee, Mike Atia, Howard Iglehart, Chung Yu Chen, Bassem Shenouda, Nash Khouzam, Hosam Haggag:
Test time reduction of successive approximation register A/D converter by selective code measurement. ITC 2005: 8
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