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"Realizing a High Measure of Confidence for Defect Level Analysis of Random ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Paresh Gondalia, Allan Gutjahr, Wen-Ben Jone (1993)

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DOI: 10.1109/TEST.1993.470663

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/GondaliaGJ93
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  persistent URL:
  - https://dblp.org/rec/conf/itc/GondaliaGJ93
Paresh Gondalia, Allan Gutjahr, Wen-Ben Jone:
Realizing a High Measure of Confidence for Defect Level Analysis of Random Testing. ITC 1993: 478-487

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