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"Integrated Test Data Decompression and Core Wrapper Design for Low-Cost ..."

Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici (2002)

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DOI: 10.1109/TEST.2002.1041746

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici:
Integrated Test Data Decompression and Core Wrapper Design for Low-Cost System-on-a-Chip Testing. ITC 2002: 64-73

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