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"Test and debug strategy for TSMC CoWoS™ stacking process based ..."
Sandeep Kumar Goel et al. (2013)
- Sandeep Kumar Goel, Saman Adham, Min-Jer Wang, Ji-Jan Chen, Tze-Chiang Huang, Ashok Mehta, Frank Lee, Vivek Chickermane, Brion L. Keller, Thomas Valind, Subhasish Mukherjee, Navdeep Sood, Jeongho Cho, Hayden Hyungdong Lee, Jungi Choi, Sangdoo Kim:
Test and debug strategy for TSMC CoWoS™ stacking process based heterogeneous 3D IC: A silicon case study. ITC 2013: 1-10
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