"Improvement of the tolerated raw bit error rate in NAND flash-based SSDs ..."

Valentin Gherman et al. (2017)

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DOI: 10.1109/TEST.2017.8242066

access: closed

type: Conference or Workshop Paper

metadata version: 2018-01-05

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Valentin Gherman, Emna Farjallah, Jean-Marc Armani, Marcelino Seif, Luigi Dilillo:
Improvement of the tolerated raw bit error rate in NAND flash-based SSDs with the help of embedded statistics. ITC 2017: 1-9

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