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"Boundary-scan adoption - an industry snapshot with emphasis on the ..."

Philip B. Geiger, Steve Butkovich (2009)

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DOI: 10.1109/TEST.2009.5355673

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Philip B. Geiger, Steve Butkovich:
Boundary-scan adoption - an industry snapshot with emphasis on the semiconductor industry. ITC 2009: 1-10

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