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"Supplying Known-Good Die for MCM Applications Using Low-Cost Embedded Testing."

A. Frisch et al. (1995)

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DOI: 10.1109/TEST.1995.529857

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/FrischAAGHMNRS95
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  persistent URL:
  - https://dblp.org/rec/conf/itc/FrischAAGHMNRS95
A. Frisch, Mitch Aigner, T. Almy, Hans J. Greub, M. Hazra, S. Mohr, Nicholas J. Naclerio, W. Russell, M. Stebniskey:
Supplying Known-Good Die for MCM Applications Using Low-Cost Embedded Testing. ITC 1995: 328-335

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