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"Effective DC fault models and testing approach for open defects in analog ..."
Baris Esen et al. (2016)
- Baris Esen, Anthony Coyette, Georges G. E. Gielen
, Wim Dobbelaere, Ronny Vanhooren:
Effective DC fault models and testing approach for open defects in analog circuits. ITC 2016: 1-9
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