"A Robust, Self-Tuning CMOS Circuit for Built-in Go/No-Go Testing of ..."

Erdem Serkan Erdogan, Sule Ozev (2006)

Details and statistics

DOI: 10.1109/TEST.2006.297696

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

a service of  Schloss Dagstuhl - Leibniz Center for Informatics