"Functional-Level Test Generation for Stuck-Open Faults in CMOS VLSI."

Yacoub M. El-Ziq, Richard J. Cloutier (1981)

> Home

Details and statistics

DOI: —

access: unavailable

type: Conference or Workshop Paper

metadata version: 2002-10-22

- no documents available
- export record
  dblp key:
  - conf/itc/El-ZiqC81
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/El-ZiqC81
Yacoub M. El-Ziq, Richard J. Cloutier:
Functional-Level Test Generation for Stuck-Open Faults in CMOS VLSI. ITC 1981: 536-546

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.