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"Characterization of Locked Combinational Circuits via ATPG."

Danielle Duvalsaint et al. (2019)

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DOI: 10.1109/ITC44170.2019.9000130

access: closed

type: Conference or Workshop Paper

metadata version: 2020-02-24

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  dblp key:
  - conf/itc/DuvalsaintJNB19
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  - https://dblp.org/rec/conf/itc/DuvalsaintJNB19
Danielle Duvalsaint, Xiaoxiao Jin, Benjamin Niewenhuis, R. D. (Shawn) Blanton:
Characterization of Locked Combinational Circuits via ATPG. ITC 2019: 1-10

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