"Pseudo-Exhaustive Adjacency Testing: A BIST Approach for Stuck-Open Faults."

Gary L. Craig, Charles R. Kime (1985)

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type: Conference or Workshop Paper

metadata version: 2002-11-11

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Gary L. Craig, Charles R. Kime:
Pseudo-Exhaustive Adjacency Testing: A BIST Approach for Stuck-Open Faults. ITC 1985: 126-139

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