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"Automatic test signal generation for mixed-signal integrated circuits ..."

Anthony Coyette et al. (2016)

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DOI: 10.1109/TEST.2016.7805867

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-02

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  - conf/itc/CoyetteEDVG16
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Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen:
Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis. ITC 2016: 1-10

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