"An Algorithm to Generate Tests for MOS Circuits at the Switch Level."

Harry H. Chen, Robert G. Mathews, John A. Newkirk (1985)

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type: Conference or Workshop Paper

metadata version: 2006-06-27

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Harry H. Chen, Robert G. Mathews, John A. Newkirk:
An Algorithm to Generate Tests for MOS Circuits at the Switch Level. ITC 1985: 304-312

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