"New R&R Methodology in Semiconductor Manufacturing Electrical Testing."

Lorella Bordogna et al. (2022)

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DOI: 10.1109/ITC50671.2022.00048

access: closed

type: Conference or Workshop Paper

metadata version: 2023-01-05

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Lorella Bordogna, Fabio Brembilla, Alberto Pagani, Marco Spinetta:
New R&R Methodology in Semiconductor Manufacturing Electrical Testing. ITC 2022: 410-419

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