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"Testability access of the high speed test features in the Alpha 21264 ..."
Dilip K. Bhavsar et al. (1998)
- Dilip K. Bhavsar, David R. Akeson, Michael K. Gowan, Daniel B. Jackson:
Testability access of the high speed test features in the Alpha 21264 microprocessor. ITC 1998: 487-495
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