"i_DD Pulse Response Testing Applied to Complex CMOS ICs."

J. S. Beasley et al. (1997)

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DOI: 10.1109/TEST.1997.639591

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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J. S. Beasley, S. Pour-Mozafari, D. Huggett, Alan W. Righter, C. J. Apodaca:
i_DD Pulse Response Testing Applied to Complex CMOS ICs. ITC 1997: 32-39

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