"Efficient Functional Safety Method for Gate-Level Fine-Grained Digital ..."

Mingjun Wang et al. (2024)

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DOI: 10.1109/ITC-ASIA62534.2024.10661312

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-14

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Mingjun Wang, Hui Wang, Jianan Mu, Zizhen Liu, Jun Gao, Jing Ye, Huawei Li, Xiaowei Li:
Efficient Functional Safety Method for Gate-Level Fine-Grained Digital Circuits with ISO-26262. ITC-Asia 2024: 1-6

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