"Crest Factor Controlled Multi-Tone Signals for Analog/Mixed-Signal IC Testing."

Yukiko Shibasaki et al. (2019)

Details and statistics

DOI: 10.1109/ITC-ASIA.2019.00015

access: closed

type: Conference or Workshop Paper

metadata version: 2020-02-06

a service of  Schloss Dagstuhl - Leibniz Center for Informatics