BibTeX record conf/itc-asia/LeeWLHL20

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@inproceedings{DBLP:conf/itc-asia/LeeWLHL20,
  author    = {Ming{-}Ting Lee and
               Chen{-}Hung Wu and
               Shi{-}Tang Liu and
               Cheng{-}Yun Hsieh and
               James Chien{-}Mo Li},
  title     = {High Efficiency and Low Overkill Testing for Probabilistic Circuits},
  booktitle = {ITC-Asia},
  pages     = {83--87},
  publisher = {{IEEE}},
  year      = {2020}
}
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