BibTeX record conf/itc-asia/LeeWLHL20

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@inproceedings{DBLP:conf/itc-asia/LeeWLHL20,
  author    = {Ming{-}Ting Lee and
               Chen{-}Hung Wu and
               Shi{-}Tang Liu and
               Cheng{-}Yun Hsieh and
               James Chien{-}Mo Li},
  title     = {High Efficiency and Low Overkill Testing for Probabilistic Circuits},
  booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2020, Taipei,
               Taiwan, September 23-25, 2020},
  pages     = {83--87},
  publisher = {{IEEE}},
  year      = {2020},
  url       = {https://doi.org/10.1109/ITC-Asia51099.2020.00026},
  doi       = {10.1109/ITC-Asia51099.2020.00026},
  timestamp = {Thu, 22 Oct 2020 12:44:28 +0200},
  biburl    = {https://dblp.org/rec/conf/itc-asia/LeeWLHL20.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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