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"Fault Modeling and Testing of Spiking Neural Network Chips."

Yi-Zhan Hsieh et al. (2021)

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DOI: 10.1109/ITC-ASIA53059.2021.9808431

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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  dblp key:
  - conf/itc-asia/HsiehTCL21
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  - https://dblp.org/rec/conf/itc-asia/HsiehTCL21
Yi-Zhan Hsieh, Hsiao-Yin Tseng, I-Wei Chiu, James Chien-Mo Li:
Fault Modeling and Testing of Spiking Neural Network Chips. ITC-Asia 2021: 1-6

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