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"BDD-Based Self-Test Program Generation for Processor Cores."

Hao Cheng et al. (2023)

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DOI: 10.1109/ITC-ASIA58802.2023.10301167

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-15

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  dblp key:
  - conf/itc-asia/ChengLCH23
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  - https://dblp.org/rec/conf/itc-asia/ChengLCH23
Hao Cheng, Chi-Jhe Li, Hung-Lin Chen, Jiun-Lang Huang:
BDD-Based Self-Test Program Generation for Processor Cores. ITC-Asia 2023: 1-6

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