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"Balancing Testability and Security by Configurable Partial Scan Design."

Xi Chen et al. (2018)

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DOI: 10.1109/ITC-ASIA.2018.00035

access: closed

type: Conference or Workshop Paper

metadata version: 2021-12-14

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Xi Chen, Omid Aramoon, Gang Qu, Aijiao Cui:
Balancing Testability and Security by Configurable Partial Scan Design. ITC-Asia 2018: 145-150

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