BibTeX record conf/isvlsi/LiRP05

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@inproceedings{DBLP:conf/isvlsi/LiRP05,
  author    = {Wei Li and
               Sudhakar M. Reddy and
               Irith Pomeranz},
  title     = {On Reducing Peak Current and Power during Test},
  booktitle = {2005 {IEEE} Computer Society Annual Symposium on {VLSI} {(ISVLSI}
               2005), New Frontiers in {VLSI} Design, 11-12 May 2005, Tampa, FL,
               {USA}},
  pages     = {156--161},
  publisher = {{IEEE} Computer Society},
  year      = {2005},
  url       = {https://doi.org/10.1109/ISVLSI.2005.53},
  doi       = {10.1109/ISVLSI.2005.53},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/conf/isvlsi/LiRP05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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