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"Deriving FSM-based tests using $a, b-\text{faults}$ for Logic Circuits."
Andrey Laputenko et al. (2022)
- Andrey Laputenko, Nina Yevtushenko, Valentina Andreeva, Anzhela Yu. Matrosova:
Deriving FSM-based tests using $a, b-\text{faults}$ for Logic Circuits. ISVLSI 2022: 80-85
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