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"Quantifying software test process and product reliability simultaneously."

Shinya Ikemoto, Tadashi Dohi, Hiroyuki Okamura (2013)

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DOI: 10.1109/ISSRE.2013.6698910

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/issre/IkemotoDO13
Shinya Ikemoto, Tadashi Dohi, Hiroyuki Okamura:
Quantifying software test process and product reliability simultaneously. ISSRE 2013: 108-117

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