"A Commercial Field-Programmable Dense eFUSE Array Memory with 99.999% ..."

Gregory Uhlmann et al. (2008)

> Home

Details and statistics

DOI: 10.1109/ISSCC.2008.4523229

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/isscc/UhlmannAKCLPRRSSI08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/isscc/UhlmannAKCLPRRSSI08
Gregory Uhlmann, Tony Aipperspach, Toshiaki Kirihata, K. Chandrasekharan, Yan Zun Li, Chris Paone, Brian Reed, Norman Robson, John Safran, David Schmitt, Subramanian S. Iyer:
A Commercial Field-Programmable Dense eFUSE Array Memory with 99.999% Sense Yield for 45nm SOI CMOS. ISSCC 2008: 406-407

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.