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"A Commercial Field-Programmable Dense eFUSE Array Memory with 99.999% ..."
Gregory Uhlmann et al. (2008)
- Gregory Uhlmann, Tony Aipperspach, Toshiaki Kirihata, K. Chandrasekharan, Yan Zun Li, Chris Paone, Brian Reed, Norman Robson, John Safran, David Schmitt, Subramanian S. Iyer:
A Commercial Field-Programmable Dense eFUSE Array Memory with 99.999% Sense Yield for 45nm SOI CMOS. ISSCC 2008: 406-407
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